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| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| 5991-4716EN Materials Measurement_ Phantoms - Application Brief c20140717 [4].pdf | 5991-4716EN Materials Measurement_ Phantoms - Application Brief c20140717 [4].pdf | 29/08/20 | Keysight Technologies Materials Measurem | 824 kB | 1 | Agilent | 5991-4716EN Materials Measurement Phantoms - Application Brief c20140717 [4] |
| 5991-4713EN Materials Measurement_ Dielectric Materials - Application Brief c20140717 [5].pdf | 5991-4713EN Materials Measurement_ Dielectric Materials - Application Brief c20140717 [5].pdf | 13/08/21 | Keysight Technologies Materials Measurem | 935 kB | 1 | Agilent | 5991-4713EN Materials Measurement Dielectric Materials - Application Brief c20140717 [5] |
| XSA_SWRev_History-WinXP X-Series Revision History - Windows XP c20140929 [87].pdf | XSA_SWRev_History-WinXP X-Series Revision History - Windows XP c20140929 [87].pdf | 27/12/19 | Instrument Software Rev | 684 kB | 4 | Agilent | XSA SWRev History-WinXP X-Series Revision History - Windows XP c20140929 [87] |
| 5991-2171EN Measuring Dielectric Properties using Keysight_2527s Materials Measurement Solutions - B | 5991-2171EN Measuring Dielectric Properties using Keysight_2527s Materials Measurement Solutions - B | 19/08/21 | Keysight Technologies Measuring Dielectr | 525 kB | 2 | Agilent | 5991-2171EN Measuring Dielectric Properties using Keysight 2527s Materials Measurement Solutions - B |
| LowCurrentHiResistance_EHandbook.pdf | LowCurrentHiResistance_EHandbook.pdf | 10/01/20 | 2202 kB | 1 | Keithley | LowCurrentHiResistance EHandbook | |
| LCHR_E-Handbook_071712.pdf | LCHR_E-Handbook_071712.pdf | 05/02/20 | 1467 kB | 1 | Keithley | LCHR E-Handbook 071712 | |
| 5990-6035EN N6141A & W6141A EMI X-Series Measurement Application - Technical Overview c20140902 [11] | 5990-6035EN N6141A & W6141A EMI X-Series Measurement Application - Technical Overview c20140902 [11] | 17/06/21 | Keysight Technologies N6141A & W6141A EM | 997 kB | 1 | Agilent | 5990-6035EN N6141A & W6141A EMI X-Series Measurement Application - Technical Overview c20140902 [11] |
| 5990-6791EN N6152A & W6152A Digital Cable TV X-Series Measurement Application - Technical Overview c | 5990-6791EN N6152A & W6152A Digital Cable TV X-Series Measurement Application - Technical Overview c | 29/11/21 | Keysight Technologies Digital Cable TV X | 2209 kB | 1 | Agilent | 5990-6791EN N6152A & W6152A Digital Cable TV X-Series Measurement Application - Technical Overview c |
| 5990-9770EN N9083A & W9083A Multi-Standard Radio (MSR) X-Series Measurement Application - Technical | 5990-9770EN N9083A & W9083A Multi-Standard Radio (MSR) X-Series Measurement Application - Technical | 03/09/21 | Keysight Technologies N9083A & W9083A Mu | 1078 kB | 1 | Agilent | 5990-9770EN N9083A & W9083A Multi-Standard Radio (MSR) X-Series Measurement Application - Technical |
| Resistance_253B DC Current_253B AC Current_253B and Frequency and Period Measurement Errors in DMMs | Resistance_253B DC Current_253B AC Current_253B and Frequency and Period Measurement Errors in DMMs | 27/05/21 | Resistance; DC Current; AC Current; and | 362 kB | 4 | Agilent | Resistance 253B DC Current 253B AC Current 253B and Frequency and Period Measurement Errors in DMMs |
| 5991-3005EN M9072A cdma2000 cdmaOne X-Series Measurement Application for PXIe Vector Signal Anlayzer | 5991-3005EN M9072A cdma2000 cdmaOne X-Series Measurement Application for PXIe Vector Signal Anlayzer | 10/11/21 | Keysight Technologies M9072A cdma2000/cd | 2258 kB | 1 | Agilent | 5991-3005EN M9072A cdma2000 cdmaOne X-Series Measurement Application for PXIe Vector Signal Anlayzer |
| N1500A Materials Measurement Suite - Technical Overview 5992-0263EN c20141204 [17].pdf | N1500A Materials Measurement Suite - Technical Overview 5992-0263EN c20141204 [17].pdf | 26/08/20 | Keysight Technologies N1500A Materials M | 7499 kB | 3 | Agilent | N1500A Materials Measurement Suite - Technical Overview 5992-0263EN c20141204 [17] |
| 5989-6532EN N9071A and W9071A GSM EDGE EVO X-Series Measurement Application - Technical Overview c20 | 5989-6532EN N9071A and W9071A GSM EDGE EVO X-Series Measurement Application - Technical Overview c20 | 26/08/21 | Keysight Technologies GSM/EDGE/EVO X-Ser | 685 kB | 3 | Agilent | 5989-6532EN N9071A and W9071A GSM EDGE EVO X-Series Measurement Application - Technical Overview c20 |
| Nano_AdvncsElctrMsmts_EBook.pdf | Nano_AdvncsElctrMsmts_EBook.pdf | 07/01/20 | A g r e At e r m e A s u r | 2716 kB | 2 | Keithley | Nano AdvncsElctrMsmts EBook |
| 5991-4739EN Materials Measurement_ Liquid Materials - Application Brief c20140805 [6].pdf | 5991-4739EN Materials Measurement_ Liquid Materials - Application Brief c20140805 [6].pdf | 28/08/20 | Keysight Technologies Materials Measurem | 1274 kB | 2 | Agilent | 5991-4739EN Materials Measurement Liquid Materials - Application Brief c20140805 [6] |
| Tips for Querying CW and Average Power Without Compromising Measurement Accuracy - Application Brief | Tips for Querying CW and Average Power Without Compromising Measurement Accuracy - Application Brief | 25/08/21 | Keysight Technologies Tips for Querying | 558 kB | 3 | Agilent | Tips for Querying CW and Average Power Without Compromising Measurement Accuracy - Application Brief |
| 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 15/09/21 | Keysight Technologies Solutions for Meas | 718 kB | 4 | Agilent | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers |
| 5990-8012EN N9076A & W9076A 1xEV-DO X-Series Measurement Application - Technical Overview c20140521 | 5990-8012EN N9076A & W9076A 1xEV-DO X-Series Measurement Application - Technical Overview c20140521 | 25/09/21 | 1xEV-DO X-Series Measurement Application | 3412 kB | 2 | Agilent | 5990-8012EN N9076A & W9076A 1xEV-DO X-Series Measurement Application - Technical Overview c20140521 |
| Making 14-Points Pulse Characterization Measurements Using the Keysight 8990B Peak Power Analyzer 59 | Making 14-Points Pulse Characterization Measurements Using the Keysight 8990B Peak Power Analyzer 59 | 24/05/21 | Keysight Technologies Making 14-Points P | 1203 kB | 3 | Agilent | Making 14-Points Pulse Characterization Measurements Using the Keysight 8990B Peak Power Analyzer 59 |
| Layout of Calibration Certificates And Measurement Reports - Application Note 5991-4233EN c20140709 | Layout of Calibration Certificates And Measurement Reports - Application Note 5991-4233EN c20140709 | 23/11/21 | Keysight Technologies Layout of Calibrat | 725 kB | 1 | Agilent | Layout of Calibration Certificates And Measurement Reports - Application Note 5991-4233EN c20140709 |